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IBIS Behavioral Models:
Micron has been a member of the IBIS Open Forum for many years and fully supports the IBIS specification. IBIS models for most Micron products are available for download from the Micron Web site.
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TN-00-07
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11/2009
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163.98 KB
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Technical Note
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Thermal Applications:
Defines a general method and criteria for measuring and ensuring that Micron components and modules do not exceed the maximum allowable temperature
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TN-00-08
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05/2010
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252.18 KB
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Technical Note
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Recommended Soldering Parameters:
Defines the recommended soldering techniques and parameters for Micron Technology, Inc., products.
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TN-00-15
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03/2007
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69.09 KB
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Technical Note
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Uprating of Semiconductors for High-Temperature Applications:
Describes the issues associated with temperature uprating and the risks involved in using components and/or systems outside the manufacturer's environmental specifications
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TN-00-18
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05/2010
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428.33 KB
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Technical Note
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Understanding Signal Integrity:
Describes how memory design, test, and verification tools can be used to the greatest advantage, from conception of a new product through end of life
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TN-00-20
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12/2009
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1.52 MB
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Technical Note
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RLDRAM 2 Design Guide:
Describes the general features of circuit implementations using RLDRAM 2 memory architecture
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TN-49-01
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06/2008
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329.19 KB
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Technical Note
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Exploring the RLDRAM 2 Feature Set:
Outlines the performance-enhancing features offered by RLDRAM 2 architecture
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TN-49-02
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12/2006
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453.86 KB
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Technical Note
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RLDRAM 2 Clocking Strategies:
Addresses the operation of the RLDRAM 2 device outside the specified range of clock periods and the timing changes that occur in this mode of operation
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TN-49-03
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05/2007
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305.07 KB
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Technical Note
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Calculating Memory System Power for RLDRAM 2:
Details how RLDRAM 2 devices consume power and provides tools to estimate power consumption
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TN-49-04
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11/2007
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1.64 MB
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Technical Note
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PCN/EOL Systems:
Explains Micron's product change notification and end-of-life systems.
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CSN-12
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08/2009
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75.58 KB
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Customer Service Note
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Wafer Packaging and Packaging Materials:
Provides complete shipping and recycling information about each of the materials used for shipping Micron's products.
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CSN-20
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09/2011
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776.24 KB
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Customer Service Note
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Bare Die SiPs and MCMs:
Describes design considerations for bare die SiPs and MCMs.
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CSN-18
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04/2009
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151.06 KB
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Customer Service Note
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Shipping Quantities:
Provides tables of part quantity.
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CSN-04
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10/2011
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463.55 KB
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Customer Service Note
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Micron KGD Definitions:
Describes the testing specifications and parameters for Micron's KGD-C1 and KGD-C2 DRAM die.
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CSN-22
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07/2009
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65.52 KB
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Customer Service Note
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Proper Handling Procedures for Modules:
Includes procedures for how to properly handle modules.
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CSN-23
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12/2007
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1.02 MB
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Customer Service Note
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Micron Component and Module Packaging:
Explanation of Micron packaging labels and procedures.
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CSN-16
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02/2012
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840.61 KB
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Customer Service Note
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ESD Precautions for Die/Wafer Handling and Assembly:
Describes the benefits of controlling ESD in the workplace, including higher yields and improved quality and reliability, resulting in reduced manufacturing costs.
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CSN-24
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08/2010
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119.08 KB
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Customer Service Note
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Electronic Data Interchange:
Describes EDI transmission sets, protocol, and contacts.
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CSN-06
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09/2005
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53.5 KB
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Customer Service Note
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RMA Procedures for Packaged Product and Bare Die Devices:
Outlines standard returned material authorization (RMA) procedures, as well as the differences associated with bare die RMAs.
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CSN-07
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10/2010
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82.64 KB
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Customer Service Note
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ISO System Management Standards:
Describes ISO system management standards.
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CSN-08
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04/2004
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39.18 KB
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Customer Service Note
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The Future of Memory and Storage:
Overview of trends for main memory and Flash memory
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12/2009
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1.54 MB
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Presentation
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RLDRAM II Power Calculator:
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08/2011
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281 KB
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Power Calculator
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DRAM Component Part Numbering System:
Part numbering guide for DDR3/DDR2/DDR/SDR SDRAM, Mobile LPDRAM, and RLDRAM components
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02/2012
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39.77 KB
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Part Numbering Guide
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FBGA Date Codes:
Date codes for FBGA-packaged components
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08/2005
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22.36 KB
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Part Numbering Guide
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Accelerate Design Cycles with Simulation Models:
Micron supplies the tools and guidelines necessary to verify new designs prior to layout. This technical note discusses software model support, signal integrity optimization, and logic circuit design.
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TN-00-09
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02/2010
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206.91 KB
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Technical Note
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Design Guide - Dealing with DDR2/DDR3 Clock Jitter:
Explores DDR2/DDR3 clock jitter specifications and provides guidance on how to apply them and how to deal with violations
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TN-04-56
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09/2008
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272.53 KB
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Technical Note
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Micron Wire-Bonding Techniques:
This technical note provides guidance on wire bonding techniques for both nickel-palladium (NiPd) and aluminum (Al) bond pads on Micron products.
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TN-00-22
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11/2010
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66.13 KB
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Technical Note
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Leverage Existing RLDRAM® 2 and DDR3 PHY to Design in New RLDRAM:
RLDRAM 3 and DDR3 PHY features comparison, highlighting how both RLDRAM 2 and DDR3 PHY can be easily leveraged to design in RLDRAM 3.
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Presentation
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05/2011
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75.75 KB
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Presentation
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Micron BGA Manufacturer's User Guide:
Provides information to enable customers to easily integrate both leading-edge and legacy Micron's ball grid array (BGA) packages into their manufacturing processes. It is intended as a set of high-level guidelines and a reference manual describing typical package-related and manufacturing process-flow practices.
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CSN-33
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07/2011
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353.32 KB
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Customer Service Note
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RLDRAM 3 Design Guide:
Contains practical recommendations for developing high-performance memory subsystems while ensuring stability for long-term reliable operation of the devices.
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TN-44-01
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08/2011
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723.41 KB
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Technical Note
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RLDRAM 3 Power Calculator:
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08/2011
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290 KB
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Power Calculator
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RLDRAM Memory Flyer :
Describes the high-bandwidth, low-latency, high-density features of RLDRAM 3 and RLDRAM 2 memory
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Product Flyer
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02/2012
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738.96 KB
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Product Flyer
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Product Marks/Product and Packaging Labels:
Explains product part marking, and product and packaging labels.
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CSN-11
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02/2012
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666.83 KB
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Customer Service Note
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Bypass Capacitor Selection for High-Speed Designs:
Describes bypass capacitor selection for high-speed designs.
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TN-00-06
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03/2011
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481.9 KB
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Technical Note
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