|
|
Thermal Applications:
Defines a general method and criteria for measuring and ensuring that Micron components and modules do not exceed the maximum allowable temperature
|
TN-00-08
|
05/2010
|
252.18 KB
|
Technical Note
|
|
|
Recommended Soldering Parameters:
Defines the recommended soldering techniques and parameters for Micron Technology, Inc., products.
|
TN-00-15
|
03/2007
|
69.09 KB
|
Technical Note
|
|
|
Uprating of Semiconductors for High-Temperature Applications:
Describes the issues associated with temperature uprating and the risks involved in using components and/or systems outside the manufacturer's environmental specifications
|
TN-00-18
|
05/2010
|
428.33 KB
|
Technical Note
|
|
|
Understanding Signal Integrity:
Describes how memory design, test, and verification tools can be used to the greatest advantage, from conception of a new product through end of life
|
TN-00-20
|
12/2009
|
1.52 MB
|
Technical Note
|
|
|
Memory Module Serial Presence-Detect:
Describes how SPD is essential in helping to standardize the configuration, timing, and manufacturing information of memory modules
|
TN-04-42
|
12/2009
|
505.83 KB
|
Technical Note
|
|
|
Comparing Module Parameters:
Compares module parameters.
|
TN-04-49
|
03/2003
|
52.71 KB
|
Technical Note
|
|
|
High-Speed DRAM Controller Design:
Identifies and discusses five key areas of DRAM controller design
|
TN-04-54
|
04/2008
|
1 MB
|
Technical Note
|
|
|
DRAM Module Form Factors:
Compares the most common DRAM module form factors
|
TN-04-55
|
09/2009
|
435.56 KB
|
Technical Note
|
|
|
Module Pinout Decoder:
Provides sorted pin assignment tables and pin location figures for use in DDR2 DIMM signal identification, tracing, and troubleshooting
|
TN-47-03
|
12/2004
|
215.46 KB
|
Technical Note
|
|
|
Design Guide for Two DDR3-1066 UDIMM Systems:
Rev. B, Design guide to assist board designers implementing products using UDIMM systems
|
TN-41-08
|
01/2010
|
1.1 MB
|
Technical Note
|
|
|
Moisture Absorption in Plastic Packages:
Describes shipping procedures for preventing memory devices from absorbing moisture and recommendations for baking devices exposed to excessive moisture
|
TN-00-01
|
02/2010
|
87.26 KB
|
Technical Note
|
|
|
Accelerate Design Cycles with Simulation Models:
Micron supplies the tools and guidelines necessary to verify new designs prior to layout. This technical note discusses software model support, signal integrity optimization, and logic circuit design.
|
TN-00-09
|
02/2010
|
206.91 KB
|
Technical Note
|
|
|
DDR3 Mini-DIMMs – Register Not Always Required:
Explanation of why DDR3 Mini-UDIMMs are the best choice for systems that don't actually require registered DIMMs.
|
TN-41-10
|
04/2010
|
225.12 KB
|
Technical Note
|
|
|
Micron Wire-Bonding Techniques:
This technical note provides guidance on wire bonding techniques for both nickel-palladium (NiPd) and aluminum (Al) bond pads on Micron products.
|
TN-00-22
|
11/2010
|
66.13 KB
|
Technical Note
|
|
|
Bypass Capacitor Selection for High-Speed Designs:
Describes bypass capacitor selection for high-speed designs.
|
TN-00-06
|
03/2011
|
481.9 KB
|
Technical Note
|